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Yield und Datenanalyse

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Applications for machine learning and Artifical Intelligence

What we mean

Together with you we define if your use cases are suitable for the application of machine learning and artificial intelligence. Typical examples in manufacturing control are automated classification of defect images and wafer signatures, detection of anomalies and discovery of connections between production related data like material-, quality-, sensor-, tool-, tracking data.

How we do it

In workshops we discuss with your process experts and technologists the possible use cases. With our team we develop, test and verify the necessary algorithms and prototypes of the applications. After a successful proof of concept phase the applications are ready for implementation.

  • Implementation
  • Organization
  • Data Analytics
  • AI Applications
  • Software Solutions
  • Yield/Quality
  • Consulting
  • Data Integration
    • application support
    • maintenance support
    • implementation & deployment support
      • yield correlation and prediction, other methods
      • data analysis and reporting application
      • data modeling
      • anomaly and outlier detection
      • data analysis and reporting application
      • image classification
      • anomaly & outlier detection
      • defect localization
      • machine learning supported labeling
      • automated quality control
      • c-Alice – our AI supported automated image classification solution for the industry
      • customized interactive dashboard
      • yield and reliability improvement
      • defect engineering
      • process control methodology
      • toolmonitoring
      • workshops
      • moderation
      • requirement analysis
      • project management

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