Working for more than 25 years in the semi­con­duc­tor indus­try Ines gai­ned a tre­men­dous know­ledge in Yield Manage­ment, Defect Engi­nee­ring and pro­cess con­trol metho­do­lo­gy. She focu­ses stron­gly on the imple­men­ta­ti­on of new tech­ni­cal methods, chan­ge manage­ment and team deve­lo­p­ment. With her addi­tio­nal qua­li­fi­ca­ti­on ‘Sys­temic coach in pro­jects’ she gui­des our cus­to­mer pro­jects also in the scope of pro­ject manage­ment, orga­niz­a­ti­on deve­lo­p­ment and cul­tu­ral aspects with gre­at passion.

Micha­el is spe­cia­li­zed in imple­men­ting methods and tools for pro­cess con­trol and data engi­nee­ring in the high-tech manu­fac­tu­ring envi­ron­ment. Star­ting from the con­cre­te user requi­re­ments to enhan­ce data dri­ven pro­duc­tion opti­miz­a­ti­on he gui­des pro­jects through the pro­to­typ­ing, imple­men­ta­ti­on and deploy­ment phase.

With 20 years of expe­ri­ence in the indus­try he sup­ports our cli­ents on an inter­na­tio­nal level.

Tho­mas is our expert for the inte­gra­ted flow of data from the machi­ne to the data con­su­mer app­li­ca­ti­on. In our cus­to­mer pro­jects he focu­ses on the pro­per sys­tem archi­tec­tu­re, data sto­rage and per­for­mance and is also the tech­ni­cal lead of our ‘con­va­nit Ana­ly­tic Lab’.
By con­so­li­da­ting, aggre­ga­ting and model­ling data com­ing from various sources he crea­tes the basis on which our Data and Yield Experts build their ana­ly­sis on. 

Ste­fan is our expert for the inte­gra­ted flow of data from the machi­ne to the data con­su­mer app­li­ca­ti­on. He takes care of the pro­gramming and imple­men­ta­ti­on of necessa­ry inter­faces, care­ful­ly matching tho­se to the uni­que pro­duc­tion envi­ron­ments of our cli­ents. By con­so­li­da­ting, aggre­ga­ting and deli­vering data com­ing from various sources he crea­tes the basis for our Data and Yield Experts to build their ana­ly­sis on. 

Kris­tins work bas­ket is data. With her rich skill­set of data ana­ly­tics methods she pas­sio­na­te­ly and per­sist­ent­ly retrie­ves hid­den infor­ma­ti­on from our cus­to­mers data. During her long stan­ding aca­de­mic care­er she was inten­si­ve­ly enga­ged in sta­tis­ti­cal data ana­ly­sis in several pro­jects. Ano­t­her favo­ri­te sub­ject of her is to pre­sent her results and to trans­fer her know­ledge to others.
From the clas­si­cal sta­tis­ti­cal approach until machi­ne lear­ning and arti­fi­cial intel­li­gence app­li­ca­ti­ons she deve­lo­ps tog­e­ther with our cli­ents the appro­pria­te stra­te­gy and solu­ti­on approach and builds pro­to­ty­pes for data ana­ly­tic applications.

Frank has more than 25 years of expe­ri­ence in semi­con­duc­tor manu­fac­tu­ring. He is spe­cia­li­zed in defect engi­nee­ring and sta­tis­ti­cal data ana­ly­sis to sup­port yield enhan­ce­ment and qua­li­ty impro­ve­ments. His tre­men­dous know­ledge in ana­ly­ti­cal methods and pro­found tech­no­lo­gi­cal expe­ri­ence in the semi­con­duc­tor manu­fac­tu­ring is of gre­at value to our clients.

Uwe has over 10 years of expe­ri­ence in using machi­ne lear­ning for image pro­ces­sing and ana­ly­sis. While he focu­sed on deve­lo­ping new tech­ni­cal methods during his aca­de­mic care­er, he late­ly enjoys crea­ting prac­ti­cal solu­ti­ons to real-world problems.